Detection of Visual Field Defect Using Topographic Evoked Potential in Children

Authors

  • P.K.H Wong
  • R. Bencivenga
  • J.E Jan
  • K Farrell

DOI:

https://doi.org/10.15353/cjo.v49i2.4549

Abstract

The interpretation of visual evoked potentials (YEP) suffers from a lack of objectivity due to several causes. First there is as yet no good biological model explaining the relation between the physiological activities occurring in the brain and the voltage variations measured during the YEP. This means that no mathe­matical standard for a "normal" reading has been set, nor a normal range of variation against which to test a YEP under investigation. There are certain features whose presence or absence are considered relevant to the analysis, like peak mor­phology and latency features, but these are difficult to code mathematically and it is not clear at all what their statistical dis­tributional properties are, both in the healthy population and in specific types of illnesses.

Author Biographies

P.K.H Wong

B.Eng., M.D., F.R.C.P. (C)

R. Bencivenga

Ph.D.

J.E Jan

M.D, F.R.C.P. (C)

K Farrell

M.B., Ch.B., D.C.H, F.R.C.P. (C)

Published

2021-10-13

How to Cite

Wong, P., Bencivenga, R., Jan, J., & Farrell, K. (2021). Detection of Visual Field Defect Using Topographic Evoked Potential in Children. Canadian Journal of Optometry, 49(2). https://doi.org/10.15353/cjo.v49i2.4549

Issue

Section

Case Reports